HOME > Presentation > Detail(Real detection of hydrogen in the semiconducting materials by means of a secondary ion mass spectrometry)坂口 勲, 渡邉 賢, 橋口 未奈子, 菱田 俊一, 大橋 直樹. STAC-7. June 19, 2013-June 21, 2013.NIMS author(s)SAKAGUCHI, IsaoOHASHI, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:52:41 +0900 Updated at: 2017-07-10 21:39:12 +0900