HOME > Presentation > Detail表面・界面磁性の新しいプローブとしてのスピン偏極-イオン散乱分光法(Spin-polarized ion scattering spectroscopy as a new analytical tool of surface and interface magnetism)鈴木 拓, 山内 泰. Atomic Level Characterizations. October 28, 2007-November 02, 2007.NIMS author(s)SUZUKI, TakuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:43:41 +0900 Updated at: 2018-05-21 20:06:30 +0900