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Siに挟まれたSiO2薄膜の電子状態計算
(Electronic structure of SiO2 thin films sandwiched between Si)

奈良 純, 近藤 恒, 大野 隆央, 山崎隆浩.
2007年秋季 第68回応用物理学会学術講演会. 2007.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at :2017-02-14 11:47:25 +0900 Updated at :2017-07-10 19:57:41 +0900

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