Electrical property of stacking faults in 4H-SiC

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陳斌, 陳君, 関口隆史, Takasumi Ohyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura.

Annual Meeting - JSAP The 56th Spring Meeting. 2009.

作成時刻: 2017-02-14 10:52:33 +0900更新時刻: 2017-07-10 20:28:04 +0900