(Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials)
International Symposium on Advanced Electron Microscopy. 2012. 招待講演
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 03:51:45 +0900更新時刻: 2024-03-05 11:43:46 +0900