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(Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials)
International Symposium on Advanced Electron Microscopy. January 05, 2012-January 07, 2012. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:51:45 +0900 Updated at: 2024-03-05 11:43:46 +0900