HOME > Presentation > Detail
Si酸化物欠陥のX線励起可視発光分析
(X-ray excited optical luminescence (XEOL) analyses of Si oxide defects)
第54回応用物理学関係連合講演会. 2007.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:12:19 +0900Updated at: 2017-07-10 19:50:08 +0900