Development of compact 4 probe AFM/KFM for investigation of electrical property in nanoscale
27th International Microprocesses and Nanotechnology Conference. 2014.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-14 11:03:13 +0900更新時刻: 2017-07-10 22:01:29 +0900