HOME > Presentation > DetailDevelopment of compact 4 probe AFM/KFM for investigation of electrical property in nanoscale新ヶ谷 義隆, 繆 滌 霏, 徐 建勛, クリーシー リアノン, 青野 正和, 中山 知信. 27th International Microprocesses and Nanotechnology Conference. 2014.NIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuNAKAYAMA, TomonobuFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-02-14 11:03:13 +0900 Updated at :2017-07-10 22:01:29 +0900