HOME > Presentation > DetailAFM探針形状補正によるナノ粒子径の精密計測(Precise Measurement of Nanoparticles Size by AFM Tip Shape Calibration)大西 桂子, 藤田 大介. 第27回表面科学講演大会. November 01, 2007-November 03, 2007.NIMS author(s)ONISHI, KeikoFUJITA, DaisukeFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:51:11 +0900Updated at: 2017-07-10 19:59:18 +0900