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Characterization of epitaxial b-FeSi2 thin films on Si substrate by SEM, EBIC and EBSD imaging
PVSEC-21. 2011.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:55:10 +0900Updated at: 2017-07-10 21:15:23 +0900