HOME > Presentation > Detail超軟X線分光による化学状態分析の可能性(The possibility of chemical state analysis by the ultrasoft x ray spectroscopy. )木村 隆, 荻原 俊弥, 福島 整, 田沼 繁夫. 第28回表面分析研究会. June 18, 2006-June 20, 2006. InvitedNIMS author(s)KIMURA, TakashiOGIWARA, ToshiyaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 03:50:42 +0900Updated at: 2024-03-05 11:41:07 +0900