HOME > Presentation > DetailHard X-ray Photoemission Spectroscopy for Investigation of Defects in Oxide crystals and films大橋 直樹, 大澤 健男, 安達 裕, 坂口 勲, 松本 研司, 羽田 肇, 上田 茂典, 吉川 英樹, 小林 啓介. 6th Asian Meeting on Electroceramics. October 22, 2008-October 24, 2008.NIMS author(s)OHASHI, NaokiOHSAWA, TakeoADACHI, YutakaSAKAGUCHI, IsaoHANEDA, HajimeUEDA, ShigenoriYOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 05:30:01 +0900Updated at: 2017-07-10 20:21:08 +0900