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(Electromagnetic properties of grain boundary Josephson junctions using high quality NdBa2Cu3O7-y thin films grown by Tri-Phase E)
The 12th International Workshop on Oxide Electronics. October 02, 2005-October 05, 2005.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-25 01:02:46 +0900 Updated at: 2017-07-10 19:26:48 +0900