(Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique)
Microscopy and Microanalysis 2012. 2012.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 04:04:26 +0900更新時刻: 2017-07-10 21:26:31 +0900