(Determination of band offsets in complex oxide thin-film heterostructures by hard x-ray photoelectron spectroscopy)
G. Conti, A. X. Gray, A. M. Kaiser, A. Greer, J. Karel, 上田 茂典, 山下 良之, A. Gloskovskii, A. Jannotti, C. G. Van de Walle, 小林 啓介, W. Drube, S. Stemmer, C. S. Fadley.