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(Determination of band offsets in complex oxide thin-film heterostructures by hard x-ray photoelectron spectroscopy)

G. Conti, A. X. Gray, A. M. Kaiser, A. Greer, J. Karel, 上田 茂典, 山下 良之, A. Gloskovskii, A. Jannotti, C. G. Van de Walle, 小林 啓介, W. Drube, S. Stemmer, C. S. Fadley.
HAXPES 2011. 2011.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-01-08 04:21:40 +0900Updated at: 2017-07-10 21:07:57 +0900

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