走査SQUID顕微鏡による酸化物超伝導薄膜中の磁束・電流・欠陥の評価手法
(Characterization of Defects, Quantized Magnetic Flux and Shielding Current Flows in Oxide Superconducting Thin Films at One Time by Scanning SQUID Microscopy)
2013 JSAP-MRS Joint Symposia. 2013.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 04:56:10 +0900更新時刻: 2017-07-10 21:36:34 +0900