HOME > Presentation > Detail走査SQUID顕微鏡による酸化物超伝導薄膜中の磁束・電流・欠陥の評価手法(Characterization of Defects, Quantized Magnetic Flux and Shielding Current Flows in Oxide Superconducting Thin Films at One Time by Scanning SQUID Microscopy)有沢 俊一, ユン キョンソン, 井口 家成, 羽多野 毅, Kazuhiro Endo, Tamio Endo. 2013 JSAP-MRS Joint Symposia. 2013.NIMS author(s)ARISAWA, ShunichiHATANO, TakeshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:56:10 +0900Updated at: 2017-07-10 21:36:34 +0900