HOME > Presentation > Detailカソードルミネッセンスによる貼り合せSiの人工界面の研究(Cathodoluminiscence Study on Artificial Grain Boundaries in Bonded Silicon Wafers)陳 君, 関口 隆史, 袁 暁利, 楊徳仁. ANCT2003. November 12, 2003-November 14, 2003.NIMS author(s)CHEN, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 03:31:10 +0900 Updated at: 2017-07-10 18:52:01 +0900