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(Ferroelectric domain engineering using scanning probe microscopy)

寺部 一弥, リウ シャオヤン, 北村 健二.
6th International Conference on Intelligent Materials and System. July 04, 2005-July 06, 2005.

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    Created at: 2017-02-14 10:54:03 +0900Updated at: 2017-07-10 19:22:18 +0900

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