口頭発表の表示
著者名 | AGEMURA, Toshihide, IWAI, Hideo, SEKIGUCHI, Takashi. |
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タイトル | Low energy secondary electron imaging of pn junctions in Si and GaN using fountain detector |
会議名 | Microscopy of Semiconducting Materials (MSM-XX) |
発表年 | 2017 |
言語 | English |
著者名 | AGEMURA, Toshihide, IWAI, Hideo, SEKIGUCHI, Takashi. |
---|---|
タイトル | Low energy secondary electron imaging of pn junctions in Si and GaN using fountain detector |
会議名 | Microscopy of Semiconducting Materials (MSM-XX) |
発表年 | 2017 |
言語 | English |