HOME > Presentation > DetailLow energy secondary electron imaging of pn junctions in Si and GaN using fountain detector揚村 寿英, 岩井 秀夫, 関口 隆史. Microscopy of Semiconducting Materials (MSM-XX). 2017.NIMS author(s)IWAI, HideoFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-07-08 23:16:56 +0900 Updated at :2018-06-05 14:10:34 +0900