HOME > Presentation > DetailDepth sectioning by 4D-scanning confocal electron microscopy technique竹口 雅樹, 濱岡 巧, 橋本 綾子, 三石 和貴. 19th International Microscopy Congress. September 09, 2018-September 14, 2018.NIMS author(s)TAKEGUCHI, MasakiHASHIMOTO, AyakoMITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-09-13 16:35:05 +0900 Updated at: 2018-09-13 16:35:05 +0900