HOME > Presentation > Detail(Bias-dependence of spectral photo-response of metal-semiconductor-metal structures on diamond)アルバレッツ ホセ アントニオ, 廖 梅勇, 小出 康夫. The 23rd International Conference on Defects in Semiconductors. July 23, 2005-July 29, 2005.NIMS author(s)LIAO, MeiyongKOIDE, YasuoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:07:35 +0900Updated at: 2017-07-10 19:22:55 +0900