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(Bias-dependence of spectral photo-response of metal-semiconductor-metal structures on diamond)

アルバレッツ ホセ アントニオ, 廖 梅勇, 小出 康夫.
The 23rd International Conference on Defects in Semiconductors. July 23, 2005-July 29, 2005.

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    Created at: 2017-02-14 11:07:35 +0900 Updated at: 2017-07-10 19:22:55 +0900

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