(Development and Application of Multiple-Scannning-Probe Microscope for Characterization of Nanomaterials on Insulator)
The 9th Japan-France Workshop on Nanomaterials. 2010.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 04:09:15 +0900更新時刻: 2017-07-10 20:57:38 +0900