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Development and Application of Multiple-Scannning-Probe Microscope for Characterization of Nanomaterials on Insulator

著者KUBO, Osamu, HIGUCHI, Seiji, KURAMOCHI, Hiromi, SHINGAYA, Yoshitaka, AONO, Masakazu, NAKAYAMA, Tomonobu.
会議名The 9th Japan-France Workshop on Nanomaterials
発表年2010
言語English

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