HOME > Presentation > Detail
(Development and Application of Multiple-Scannning-Probe Microscope for Characterization of Nanomaterials on Insulator)
The 9th Japan-France Workshop on Nanomaterials. 2010.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:09:15 +0900Updated at: 2017-07-10 20:57:38 +0900