Synchrotron x-ray diffraction-based visualization of lattice-plane tilting of a GaN substrate and homo-epitaxial thin film
16th China International Forum on Solid State Lighting & 2019 International Forum on Wide Bandgap Semiconductors (SSLCHINA&IFWS 2019). 2019. 招待講演
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2019-11-30 03:00:19 +0900更新時刻: 2024-03-05 12:21:15 +0900