Synchrotron x-ray diffraction-based visualization of lattice-plane tilting of a GaN substrate and homo-epitaxial thin film

16th China International Forum on Solid State Lighting & 2019 International Forum on Wide Bandgap Semiconductors (SSLCHINA&IFWS 2019). November 25, 2019-November 27, 2019. Invited

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2019-11-30 03:00:19 +0900Updated at: 2024-03-05 12:21:15 +0900