HOME > Presentation > DetailGrowth feature characterization of laser annealed GeSn films on insulators by EBSD methodMATSUMURA, Ryo, JEVASUWAN, Wipakorn, FUKATA, Naoki. Microscopy Conference 2019. 2019.NIMS author(s)MATSUMURA, RyoJEVASUWAN, WipakornFUKATA, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-09-18 03:00:17 +0900Updated at: 2019-09-18 03:00:17 +0900