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Effect of Conduction Band Offset on Gate Leakage Current at SiO2/4H-SiC (000-1) studied by Hard X-ray Photoelectron Spectroscopy
SSDM2018. September 09, 2018-September 13, 2018.
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Created at: 2018-08-08 15:53:11 +0900 Updated at: 2018-08-08 15:53:11 +0900