HOME > 口頭発表 > 書誌詳細Gap States at SiO2/4H-SiC interface obtained from Oprando Hard X-ray Photoelectron SpectroscopyYAMASHITA, Yoshiyuki, INDARI, Efi Dwi, 蓮沼 隆. THE 9th INTERNATIONAL CONFERENCE ON HARD X-Ray PHOTOELECTRON SPECTROSCOPY. 2022.NIMS著者山下 良之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2023-01-14 03:33:11 +0900更新時刻: 2023-01-14 03:33:11 +0900