HOME > 口頭発表 > 書誌詳細Characterization of superconducting thin films by scanning SQUID microscopy and their device applications有沢 俊一. The First NIMS (Japan) – IMRE (Singapore) Workshop on Mate. 2015.NIMS著者有沢 俊一Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-14 11:09:58 +0900更新時刻: 2017-07-10 22:15:36 +0900