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Characterization of superconducting thin films by scanning SQUID microscopy and their device applications
The First NIMS (Japan) – IMRE (Singapore) Workshop on Mate. 2015.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:09:58 +0900Updated at: 2017-07-10 22:15:36 +0900