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Electron-beam-induced Current Study of Dislocations and Leakage Sites in GaN Schottky Barrier Diodes

CHEN, Jun, YI, Wei, KIMURA, Takashi, SEKIGUCHI, Takashi, Ryo TANAKA, Shinya TAKASHIMA, Masaharu EDO.
DRIP XVIII. 2019.

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Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2019-09-20 03:00:21 +0900Updated at: 2019-09-20 03:00:21 +0900

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