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Deep-Level Defects and Turn-On Recovery Characteristics in AlGaN/GaN Hetero-Structures Containing Various Carbon Concentrations

著者Y. Naknao, 色川 芳宏, 角谷 正友, Y. Sumida, S. Yagi, H. Kawai.
会議名2013 MRS Fall meeting
発表年2013
言語Japanese

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