HOME > 口頭発表 > 詳細Deep-Level Defects and Turn-On Recovery Characteristics in AlGaN/GaN Hetero-Structures Containing Various Carbon Concentrations著者Y. Naknao, 色川 芳宏, 角谷 正友, Y. Sumida, S. Yagi, H. Kawai. 会議名2013 MRS Fall meeting発表年2013言語Japanese
