Cathodoluminescence characterization of GaN-based materials: From wafer-scale mapping to nano-scale 3D analysis
著者 | KIMURA, Takashi, YI, Wei, CHEN, Jun, SEKIGUCHI, Takashi. |
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会議名 | 8th International Symposium on Practical Surface Analysis (PSA19) |
発表年 | 2019 |
言語 | English |