Cathodoluminescence characterization of GaN-based materials: From wafer-scale mapping to nano-scale 3D analysis
| 著者 | KIMURA, Takashi, YI, Wei, CHEN, Jun, SEKIGUCHI, Takashi. |
|---|---|
| 会議名 | 8th International Symposium on Practical Surface Analysis (PSA19) |
| 発表年 | 2019 |
| 言語 | English |