HOME > 口頭発表 > 書誌詳細Cathodoluminescence characterization of GaN-based materials: From wafer-scale mapping to nano-scale 3D analysisKIMURA, Takashi, YI, Wei, CHEN, Jun, SEKIGUCHI, Takashi. 8th International Symposium on Practical Surface Analysis (PSA19). 2019.NIMS著者木村 隆イ ウェイ陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-01-22 03:00:25 +0900更新時刻: 2020-01-22 03:00:25 +0900