HOME > Presentation > Detail(De Haas-van Alphen Effect Measurements under High Pressure -Application to CeRhSi3 )寺嶋 太一, 松本 武彦, 宇治 進也, N. Kimura, H. Aoki. Yamada Conference LX RHMF2006. 2006.NIMS author(s)TERASHIMA, TaichiUJI, ShinyaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:14:09 +0900Updated at: 2018-05-21 19:52:01 +0900