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電子線誘起電流（EBIC）法を用いた多結晶Si中の粒界の電気的活性度評価
(EBIC characterization of grain boundaries in multicrystalline Si)
2007年春季第54回応用物理学関係連合講演会. 2007. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:21:39 +0900Updated at: 2024-03-05 11:41:25 +0900