Diffraction mapping for evaluation of the lattice constant deviation at thin film interface
The 3rd East-Asia Microscopy Conference. 2017.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-11-22 22:45:09 +0900更新時刻: 2018-06-05 14:15:03 +0900