HOME > 口頭発表 > 書誌詳細Reliability analysis of electronic device by using synchrotron X-ray nano-CT: Microstructural evolution of electrodes of MLCC大熊 学. 9th Tsukuba International Coating Symposium (TICS9). 2021. 招待講演NIMS著者大熊 学Materials Data Repository (MDR)上の本文・データセット作成時刻 :2021-12-15 03:39:18 +0900 更新時刻 :2024-03-05 12:21:47 +0900