HOME > Presentation > DetailReliability analysis of electronic device by using synchrotron X-ray nano-CT: Microstructural evolution of electrodes of MLCC大熊 学. 9th Tsukuba International Coating Symposium (TICS9). 2021. InvitedNIMS author(s)OKUMA, GakuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2021-12-15 03:39:18 +0900Updated at: 2024-03-05 12:21:47 +0900