HOME > Published patent applications > Detail[Published patent application] ワイドギャップ半導体のバンドギャップ電子物性の計測方法2011-04-21. 2011082353 (Google Patents) , 5541664NIMS author(s)SUMIYA, MasatomoIROKAWA, YoshihiroCreated at :2023-07-22 21:45:28 +0900 Updated at :2023-07-22 21:45:28 +0900
