HOME > Published patent applications > Detail[Published patent application] 接触電位および比誘電率の測定システムおよび測定方法2026-02-18. 2026026493 (Google Patents) NIMS author(s)YAGYU, ShinjiroNAGATA, TakahiroCreated at :2026-02-25 03:15:38 +0900 Updated at :2026-02-25 03:15:38 +0900
