金属/酸化膜界面への化学的なデーター書き込み：低次元界面反応のI-V測定による評価
(Chemical Data Writing into Metal/oxide Interface: Characterization of Low Dimensional Interface Reactions by I-V Measurements)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 12:02:34 +0900 Updated at: 2022-09-05 12:02:34 +0900