HOME > その他の文献 > 書誌詳細EBIC study of dislocations and stacking faults in 4H-SiC homoepitaxial filmsCHEN, Bin, CHEN, Jun, SEKIGUCHI, Takashi, Takasumi Oyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura, FILIPPOFabbri. Publication name Proc. of the 5th International Symposium on Advanced Science and Technology of Silicon Materials 299-303. 2008.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 12:09:45 +0900更新時刻: 2022-09-05 12:09:45 +0900
