HOME > その他の文献 > 詳細Laboratory Based Hard X-ray Photoelectron Spectroscopy for Buried Interface Analysis of Microelectronic Components著者W Hamouda,, C. Lubin, 上田 茂典, 山下 良之, O. Renault, F. Mehmood, T. Mikolajick, U. Schroeder, R. Negrea, N. Barrett. 掲載誌名Scienta Omicron Result of the Month 1-1出版社出版年2021言語English