SAMURAI - NIMS Researchers Database

HOME > Misc > Detail

Laboratory Based Hard X-ray Photoelectron Spectroscopy for Buried Interface Analysis of Microelectronic Components

W Hamouda,, C. Lubin, 上田 茂典, 山下 良之, O. Renault, F. Mehmood, T. Mikolajick, U. Schroeder, R. Negrea, N. Barrett.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2021-10-29 03:35:17 +0900 Updated at: 2021-10-29 03:35:17 +0900

    ▲ Go to the top of this page