HOME > Misc > DetailLaboratory Based Hard X-ray Photoelectron Spectroscopy for Buried Interface Analysis of Microelectronic ComponentsW Hamouda,, C. Lubin, 上田 茂典, 山下 良之, O. Renault, F. Mehmood, T. Mikolajick, U. Schroeder, R. Negrea, N. Barrett. Scienta Omicron Result of the Month 1-1. 2021.NIMS author(s)UEDA, ShigenoriYAMASHITA, YoshiyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2021-10-29 03:35:17 +0900 Updated at: 2021-10-29 03:35:17 +0900