HOME > Misc > DetailEXPLORATION OF NANO FUNCTIONALITY WITH EXTREME FIELD SCANNING TUNNELING MICROSCOPYFUJITA, Daisuke, SAGISAKA, Keisuke, ONISHI, Keiko, SAKOTSUBO, Yukihiro, OHGI, Taizo. Proceedings of APF10 19-26. 2005.NIMS author(s)SAGISAKA, KeisukeONISHI, KeikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 11:47:06 +0900 Updated at: 2022-09-05 11:47:06 +0900
