HOME > 書籍 > 書誌詳細Defect Characterization in Silicon by Electron-Beam-Induced Current and Cathodoluminescence TechniquesSEKIGUCHI, Takashi, CHEN, Jun. Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering 343-373. 2016.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-11-23 21:10:35 +0900更新時刻: 2018-05-30 20:16:20 +0900
